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Atomic Force Microscope: A Comprehensive Overview
An Atomic Force Microscope (AFM) is an advanced scientific instrument widely used for imaging, measuring, and manipulating matter at the nanoscale. Since its introduction in the 1980s, AFM has become one of the most versatile tools in nanotechnology, enabling researchers to visualize surfaces with atomic-level precision. Unlike traditional optical microscopes limited by the wavelength of light, AFM uses a mechanical probe to scan surfaces, allowing it to achieve incredibly high resolution.
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